Field emission and electron microscopy

Microscopy and Microanalysis

Volumn 6, Issue 4, 2000, Pages 380-387

  Edgcombe, Christopher John ^a,b   Valdrè, Ugo ^a,c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b Granta Electronics Ltd   (United Kingdom)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Carbon contamination; Electron guns; Field emission; Finite element analysis; Nano tips; Scanning electron microscopy; Scanning transmission electron microscopy; Specimen holders; Transmission electron microscopy; Work function

Indexed keywords

EID: 0039001973     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927602000648     Document Type: Article

References (5)

1. Antognozzi M, Sentimenti A, Valdrè U (1997) Fabrication of nanotips by carbon contamination in a scanning electron microscope for use in scanning probe microscopy and field emission. Microsc Microanal Microstruct 8:355-368
2. Gomer R (1962) Field Emission and Field lonization. Cambridge, MA: Harvard University Press, p 45
3. Good RH, Müller EW (1956) Field emission. In: Encyclopaedia of Physics, Flügge S (ed). Berlin: Springer-Verlag, pp 176-231
4. James EM, Valdrè U (1995) In-situ characterization of nanometresized field emitters by observation in STEM. Inst Phys Conf Ser 147:293-296
5. Valdrè G, Valdrè U (1994) Novel in-situ sharpening of nano-size field emitters by proton erosion. In: Proceedings of the 13th International Congress on Electron Microscopy. Paris, France, 17-22 July 1994, Vol 1: Interdisciplinary Developments and Tools, pp 177-178