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Volumn 63, Issue 12, 2001, Pages

Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DIFFUSION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; EVAPORATION; FILM; OSCILLATION; QUANTUM MECHANICS; SEMICONDUCTOR;

EID: 0034907085     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.125404     Document Type: Article
Times cited : (21)

References (28)
  • 27
    • 0037973942 scopus 로고
    • C. Godrche, Cambridge University Press, New York
    • P. Nozieres, in Solid Far From Equilibrium, edited by C. Godrche (Cambridge University Press, New York, 1991), pp. 135-143.
    • (1991) In Solid Far from Equilibrium , pp. 135-143
    • Nozieres, P.1
  • 28
    • 0141621030 scopus 로고    scopus 로고
    • Characterization of Amorphous and Crystalline Rough Surfaces-Principles and Applications
    • Academic Press, New York
    • Y. P. Zhao, G.-C. Wang, and T.-M. Lu, Characterization of Amorphous and Crystalline Rough Surfaces-Principles and Applications, Experimental Methods in the Physical Science Vol. 37 (Academic Press, New York, 2000).
    • (2000) Experimental Methods in the Physical Science , vol.37
    • Zhao, Y.P.1    Wang, G.-C.2    Lu, T.-M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.