Effect of fatigue on the pyroelectric and dielectric properties of PZT films

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 1589-1592

  Wang, B ^a   Chan, H L W ^a   Kwok, K W ^a   Ploss, Beatrix ^a   Choy, C L ^a   Tong, K Y ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Dielectric properties; Fatigue; Pyroelectric coefficient; PZT

Indexed keywords

CRYSTALLIZATION; FATIGUE OF MATERIALS; FATIGUE TESTING; PERMITTIVITY; POLARIZATION; PYROELECTRICITY; SUBSTRATES; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

SWITCHABLE POLARIZATION;

THIN FILMS;

CERAMICS;

EID: 0034893880     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00071-1     Document Type: Article

References (13)

1. Ferroelectric memories
2. Ferroelectric thin films for micro-sensors and actuators: A review
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4. Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O-3 films
5. Fatigue of piezoelectric properties in Pb(Zr,Ti)O-3 films
6. Microstructure and 90 degrees domain assemblages of Pb(Zr,Ti)O-3//RuO2 capacitors as a function of Zr-to-Ti stoichiometry
7. Single-crystal Pb(ZrxTil-X) O-3 thin films prepared by metal-organic chemical vapor deposition: Systematic compositional variation of electronic and optical properties
8. Measurement of the pyroelectric coefficient in composites using a temperature-modulated excitation
9. The effect of RuO2/Pt hybrid bottom electrode structure on the microstructure and ferroelectric properties of solgel derived PZT thin films
10. Removal of 90 degrees domain pinning in (100) Pb(Zr0.15Ti0.85)0-3 thin films by pulsed operation
11. Electronic domain pinning in Pb(Zr,Ti)03 thin-films and its role in fatigue
12. Discrimination between bulk and interface scenarios for the suppression of the switchable polarization (fatigue) in Pb(Zr,Ti)O-3 thin films capacitors with Pt electrodes
13. Fatigued state of the Pt-PZT-Pt system