γ-ray irradiation effect on hysteresis symmetry and data retention of Pt/SrBi2Ta2O9/Pt thin-film capacitors

Applied Physics A: Materials Science and Processing

Volumn 73, Issue 2, 2001, Pages 255-257

  Wu, D ^a   Li, A D ^a   Ling, H Q ^a   Yu, T ^a   Liu, Z G ^a   Ming, N B ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRIC POTENTIAL; FERROELECTRIC THIN FILMS; HYSTERESIS; IRRADIATION; PLATINUM; POLARIZATION; REMANENCE; STRONTIUM COMPOUNDS;

DATA RETENTION; HYSTERESIS SYMMETRY; POLARIZATION-VOLTAGE CURVES; REMANENT POLARIZATION; THIN FILM CAPACITORS;

CAPACITORS;

EID: 0034888658     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100905     Document Type: Article

References (22)