Photocurrent estimation from multiple non-destructive samples in a CMOS image sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4306, Issue , 2001, Pages 450-458

  Liu, X ^a   El Gamal, A ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; IMAGE RECONSTRUCTION; NONDESTRUCTIVE EXAMINATION; PHOTOCURRENTS; RECURSIVE FUNCTIONS;

NON-DESTRUCTIVE SAMPLES;

IMAGE SENSORS;

EID: 0034873655     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.426983     Document Type: Conference Paper

References (5)

1. Wide intrascene dynamic range CMOS APS using dual sampling
2. A 640×512 CMOS image sensor with ultra-wide dynamic range floating-point pixel level ADC
3. Comparative analysis of SNR for image sensors with enhanced dynamic range
4. Integration of image capture and processing - Beyond single chip digital camera