Electronic effects in scanning tunneling microscopy of dendritic, Cr-filled carbon nanotubes

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 16, 2001, Pages

  Zha, F X ^a,b   Carroll, D L ^c   Czerw, R ^c   Loiseau, A ^d   Pascard, H ^e   Clauss, W ^b   Roth, S ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b UNIVERSITY OF TÜBINGEN   (Germany)

^c CLEMSON UNIVERSITY   (United States)

^d Centre National de la Recherche Scientifique   (France)

^e LABORATOIRE DES SOLIDES IRRADIÉS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHROMIUM;

ARTICLE; ELECTRONICS; MATERIALS; MATERIALS TESTING; SCANNING TUNNELING MICROSCOPY; VACUUM;

EID: 0034870204     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.165432     Document Type: Article

References (23)

1. N. Demoncy, O. Stiphan, N. Brun, C. Colliex, A. Loiseau, and H. Pascard, Eur. Phys. J. B 4, 147 (1998), and references therein.
2. P. M. Ajayan, S. Iijima, Nature (London) 361, 333 (1993).
3. E. Dujardin, T. W. Ebbesen, H. Hiura, and K. Tanigaki, Science 265, 1850 (1994).
4. P.M. Ajayan, O. Stephan, Ph. Redlich, and C. Colliex, Nature (London) 375, 564 (1995).
5. S. C. Tsang, Y. K. Chen, P. J. F. Harris, and M. L. H. Green, Nature (London) 373, 159 (1994).
6. C. C. Guerret-Piecourt, Y. L. Bouar, A. Loiseau, and H. Pascard, Nature (London) 372, 761 (1994).
7. F. Okuyama and I. Ogasawara, Appl. Phys. Lett. 71, 623 (1997).
8. F. Okuyama, T. Hayashi, and Y. Fujimoto, J. Appl. Phys. 84, 1626 (1999).
9. W. Wernsdorfer, E. Bonet Orozco, K. Hasselbach, A. Benoit, B. Barbara, N. Demoncy, A. Loiseau, H. Pascard, and D. Mailly, Phys. Rev. Lett. 78, 1791 (1997).
10. A. Loiseau, N. Demoncy, O. Stephan, C. Colliex and H. Pascard, in Proceedings of the International Workshop on the Science and Applications of Nanotubes, East Lansing, Michigan, 1999, edited by M. F. Thorpe (Kluwer, Dordrecht, 1999).
11. H. Hirura, T. W. Ebbesen, J. Fujita, K. Tanigaki, and T. Takada, Nature (London) 367, 148 (1994).
12. C. R. Clemmer and T. P. Beebe, Science 251, 640 (1991).
13. F.-X. Zha, R. Czerw, D. L. Carroll, Ph. Redlich, B.-Q. Wei, A. Loiseau, and S. Roth, Phys. Rev. B 61, 4884 (2000).
14. L.P. Biró, J. Gyulai, Ph. Lambin, J. B. Nagy, S. Lazarescu, G. I. Mark, A. Fonseca, P. R. Surjan, Zs. Szekeres, P. A. Thiry, and A. A. Lucas, Carbon 36, 689 (1998).
15. T. Tiedje, J. Varon, H. Deckman, and J. Stokes, J. Vac. Sci. Technol. A 6, 372 (1988).
16. E. W. Wong, P. E. Sheehan, and C. M. Lieber, Science 277, 1971 (1997).
17. H. J. Mamin, E. Ganz, D. W. Abraham, R. E. Thomson, and J. Clarke, Phys. Rev. B 34, 9015 (1986).
18. W. Clauss, J. Zhang, D. J. Bergeron, and A. T. Johnson, J. Vac. Sci. Technol. B 17, 1309 (1999).
19. D. Tekleab, R. Czerw, A. Rubio, P. M. Ajayan, and D. L. Carroll, in Amorphous and Nanostructure Carbon edited by J. Robertson, J. P. Sullivan, O. Zhou, and T. B. Allen, Mater. Res. Soc. Symp. Proc. 593 (Materials Research Society, Pittsburgh, 2000), pp. 155-159.
20. R. J. Hamers, in Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications, edited by D. A. Bonnell (VCH, New York, 1993).
21. N. D. Lang, Phys. Rev. B 37, 10 395 (1988).
22. J. H. Coombs and J. B. Pethica, IBM J. Res. Dev. 30, 455 (1986).
23. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Appl. Phys. Lett. 40, 178 (1982)