Detective quantum efficiency of an x-ray image intensifier chain as a benchmark for amorphous silicon flat panel detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4320, Issue , 2001, Pages 115-120

  Koch, A ^a   Macherel, J M ^a   Wirth, T ^a   De Groot, P ^a   Ducourant, T ^a   Couder, D ^a   Moy, J P ^a   Calais, E ^a  

^a NONE

Author keywords

Amorphous silicon; Detective quantum efficiency; Flat panel detector; Fluoroscopy; Medical imaging; Radiography; X ray detector; X ray image intensifier

Indexed keywords

AMORPHOUS SILICON; CAMERAS; DOSIMETRY; IMAGE INTENSIFIERS (ELECTRON TUBE); IMAGE QUALITY; MEDICAL IMAGING; QUANTUM EFFICIENCY; RADIOGRAPHY;

AMORPHOUS SILICON FLAT PANEL DETECTORS; FLUOROSCOPY; X-RAY IMAGE INTENSIFIER;

X RAYS;

EID: 0034867699     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.430919     Document Type: Conference Paper

References (5)

1. Amorphous silicon x-ray image sensor
2. Optimization of key blocks for a large area radiographic and fluoroscopic dynamic digital x-ray detector based on a-Si:H/CsI:Tl flat panel technology
3. Self-normalizing method to measure the detetictive quantum efficiency of a wide range of x-ray detectors
4. Signal-to-noise ratio and spatial resolution in x-ray electronic imagers: Is the MTF a relevant parameter?