Hyperspectral imaging of breakdown in InAlAs/InGaAs HEMTs: A comparative study

Annual Device Research Conference Digest

Volumn , Issue , 2001, Pages 65-66

  Somerville, M ^a   Rameau, J ^a   Addo, N M ^a  

^a VASSAR COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER CONTROL SYSTEMS; ELECTRIC BREAKDOWN OF SOLIDS; IMAGING TECHNIQUES; PHOTOEMISSION; PHOTONS; SEMICONDUCTOR DOPING;

HYPERSPECTRAL IMAGING;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0034866849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)