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Volumn , Issue , 2001, Pages 550-554

Fast power/ground network optimization based on equivalent circuit modeling

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; COMPUTER WORKSTATIONS; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT LAYOUT; LINEAR PROGRAMMING; MICROPROCESSOR CHIPS; RESISTORS;

EID: 0034853864     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2001.156200     Document Type: Article
Times cited : (66)

References (9)
  • 1
    • 0014630193 scopus 로고    scopus 로고
    • Electromigration failure modes in aluminum metalization for semiconductor devices
    • Sept
    • (1996) Proc. of IEEE , vol.57 , pp. 1587-1597
    • Black, J.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.