Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings

Proceedings - Design Automation Conference

Volumn , Issue , 1999, Pages 78-83

  Tan, Xiang Dong ^a   Shi, C J Richard ^a   Lungeanu, Dragos ^a   Lee, Jyh Chwen ^a   Yuan, Li Pen ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; CONVERGENCE OF NUMERICAL METHODS; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT LAYOUT; LINEAR PROGRAMMING; NONLINEAR PROGRAMMING; RELIABILITY;

SEQUENCE-OF-LINEAR-PROGRAMMING METHODS;

VLSI CIRCUITS;

EID: 0032643254     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/309847.309880     Document Type: Conference Paper

References (10)