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Rapid Communications in Mass Spectrometry

Volumn 15, Issue 17, 2001, Pages 1621-1624

An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry

(5) Barison, Simona a Barreca, Davide b Daolio, Sergio a Fabrizio, Monica a Tondello, Eugenio b

a Ist Polarografia Ed E (Italy)

b UNIVERSITY OF PADOVA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COBALT COMPOUNDS; INDIUM COMPOUNDS; NANOCRYSTALS; OXIDE FILMS; SECONDARY EMISSION; SUBSTRATES; THIN FILMS; TIN OXIDES;

CHEMICAL VAPOUR DEPOSITION; DEPOSITION TEMPERATURES; FILM COMPOSITION; FILM/SUBSTRATE; INDIUM TIN OXIDE SUBSTRATES; MASS SPECTROMETRY ANALYSIS; NANOCRYSTALLINE THIN FILMS; PRECURSOR CONVERSION; SECONDARY ION-MASS SPECTROMETRY; SYNTHESISED;

SECONDARY ION MASS SPECTROMETRY;

COBALT DERIVATIVE; OXIDE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; CRYSTALLIZATION; DRY DEPOSITION; FILM; MASS SPECTROMETRY; NANOPARTICLE; SYNTHESIS; VAPOR;

EID: 0034845913 PISSN: 09514198 EISSN: None Source Type: Journal
DOI: 10.1002/rcm.397 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.