Motivating hierarchical run-time models in measurement and control systems

Proceedings of the American Control Conference

Volumn 5, Issue , 2001, Pages 3457-3462

  Liu, Jie ^a   Jefferson, Stanley ^b   Lee, Edward A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b AGILENT LABORATORIES   (United States)

Author keywords

Embedded systems; Hierarchical heterogeneity; Real time systems; Run time models

Indexed keywords

ALGORITHMS; DATA PROCESSING; DISTRIBUTED COMPUTER SYSTEMS; EMBEDDED SYSTEMS; FEEDBACK CONTROL; FINITE AUTOMATA; HIERARCHICAL SYSTEMS; REAL TIME SYSTEMS; SAMPLED DATA CONTROL SYSTEMS;

HIERARCHICAL HETEROGENEITY; HIERARCHICAL RUN-TIME MODELS; MEASUREMENT AND CONTROL SYSTEMS;

COMPUTER SOFTWARE;

EID: 0034842164     PISSN: 07431619     EISSN: None     Source Type: Journal    
DOI: 10.1109/ACC.2001.946165     Document Type: Article

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