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Microelectronic Engineering

Volumn 55, Issue 1-4, 2001, Pages 233-241

Structural and optical properties of Fe1-xMxSi2 thin films (M = Co, Mn; 0≤x≤0.20)

(6) Fanciulli, M a Zenkevich, A b,e Weyer, G b Vanzini, C c Tresso, E c Baricco, M d

a LABORATORIO MDM (Italy)

b AARHUS UNIVERSITY (Denmark)

c POLITECNICO DI TORINO (Italy)

d UNIVERSITY OF TURIN (Italy)

e NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; IRON COMPOUNDS; LIGHT TRANSMISSION; MOSSBAUER SPECTROSCOPY; RAMAN SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CONVERSION ELECTRON MOESSBAUER SPECTROSCOPY (CEMS); PULSED LASER DEPOSITION;

OPTICAL FILMS;

EID: 0034836174 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/S0167-9317(00)00453-6 Document Type: Article

Times cited : (17)

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