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Volumn 174, Issue 1-2, 2001, Pages 199-204

Two-beam irradiation chamber for in situ ion-implantation and RBS at temperatures from 15 K to 300 K

Author keywords

[No Author keywords available]

Indexed keywords

ION IMPLANTATION; RADIATION DAMAGE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0034832548     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00433-X     Document Type: Article
Times cited : (63)

References (15)
  • 8
    • 0004242004 scopus 로고
    • (ISBN 0 85296 485 4), INSPEC, The Institution of Electrical Engineers, London and New York
    • Properties of Gallium Arsenide (ISBN 0 85296 485 4), INSPEC, The Institution of Electrical Engineers, London and New York, 1990.
    • (1990) Properties of Gallium Arsenide
  • 12
    • 0343249834 scopus 로고    scopus 로고
    • Ph.D. Thesis, FSU Jena
    • B. Breeger, Ph.D. Thesis, FSU Jena, 2000.
    • (2000)
    • Breeger, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.