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Volumn 53, Issue 12, 1996, Pages 7823-7835

Point defects and their reactions in-irradiated GaAs investigated by x-ray-diffraction methods

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000903921     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.7823     Document Type: Article
Times cited : (50)

References (45)
  • 8
    • 0011237289 scopus 로고
    • F.L. Vook, Phys. Rev. 135, A1742 (1964).
    • (1964) Phys. Rev. , vol.135 , pp. A1742
    • Vook, F.1
  • 13
    • 0007599509 scopus 로고
    • D.W. Palmer, in Radiation Effects in Semiconductors, edited by N. B. Urli and J. W. Corbett, IOP Conf. Proc. No. 31 (Institute of Physics, London, 1977), p. 144.
    • (1977) Radiation Effects in Semiconductors , pp. 144
    • Palmer, D.1
  • 27
    • 85037884593 scopus 로고    scopus 로고
    • O.S. Oen (unpublished).
    • Oen, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.