Amorphous oxysulfide thin films MOySz (M = W, Mo, Ti) XPS characterization: Structural and electronic pecularities

Applied Surface Science

Volumn 173, Issue 1-2, 2001, Pages 140-150

  Dupin, J C ^a   Gonbeau, D ^a   Martin Litas, I ^b   Vinatier, Ph ^b   Levasseur, A ^b  

^a UNIVERSITÉ DE PAU ET DES PAYS DE L'ADOUR   (France)

^b Ecole Nationale Superieure de Chimie et de Physique de Bordeaux   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; MOLYBDENUM COMPOUNDS; SPUTTERING; SULFUR COMPOUNDS; THIN FILMS; TITANIUM COMPOUNDS; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDATION NUMBERS;

SURFACE STRUCTURE;

EID: 0034832077     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00893-X     Document Type: Article

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