DYNAD: A Framework IV SMT project addressed to the development of dynamic test techniques for analog-to-digital converters

Computer Standards and Interfaces

Volumn 22, Issue 2, 2000, Pages 113-119

  Morandi, C ^a   Chiorboli, G ^a   Dallet, D ^b   Haddadi, D ^b   Mazzoleni, S ^c   Machado Da Silva, J ^d   Pernull, H ^e   Roy, P Y ^f  

^a UNIVERSITY OF PARMA   (Italy)

^b Domaine Universitaire   (France)

^c Italtel SpA   (Italy)

^d UNIVERSITY OF PORTO   (Portugal)

^e INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

^f THALES   (France)

Author keywords

A D converters; A D testing; DYNAD; Dynamic errors; Sine wave testing

Indexed keywords

EID: 0003693827     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(00)00037-4     Document Type: Article

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