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Volumn 11, Issue 2, 2001, Pages

The prospects of reflectometry and ellipsometry with colorado state university tabletop XUV laser

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; ELECTROMAGNETIC WAVE REFLECTION; ELLIPSOMETRY; MULTILAYERS; REFLECTOMETERS; THICKNESS MEASUREMENT;

EID: 0034826821     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.