Deposition of gold clusters on atomically flat gold films

Applied Physics A: Materials Science and Processing

Volumn 72, Issue 8, 2001, Pages

  Vandamme, N ^a   Verschoren, G ^a   Depuydt, A ^a   Cannaerts, M ^a   Bouwen, W ^a   Lievens, P ^a   Silverans, R E ^a   Van Haesendonck, C ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; EVAPORATION; MASS SPECTROMETRY; METALLIC FILMS; MICA; MONOLAYERS; PRESSURE EFFECTS; SCANNING TUNNELING MICROSCOPY; THERMAL EFFECTS; THICKNESS MEASUREMENT;

FILM THICKNESS; GOLD FILM; LASER VAPORIZATION; LOW-ENERGY BEAM DEPOSITION;

GOLD;

EID: 0034820884     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100660     Document Type: Article

References (30)

1. W.A. De Heer: Rev. Mod. Phys. 65, 611 (1993)
2. P. Jensen: Rev. Mod. Phys. 71, 1695 (1999)
3. C. Schönenberger, H. Van Houten, H.C. Donkersloot: Europhys. Lett. 20, 249 (1992);
4. D.C. Ralph, C.T. Black, M. Tinkman: Phys. Rev. Lett. 74, 3241 (1995);
5. A. Bettac, L. Koller, V. Rank, K.H. Meiwes-Broer: Surf. Sci. 402-404, 475 (1998);
6. T.P. Bigioni, L.E. Harrell, W.G. Cullen, D.E. Guthrie, R.L. Whetten, P.N. First: Eur. Phys. J. D 6, 355 (1999);
7. H. Hovel, B. Grimm, M. Bodecker, K. Fieger, B. Reihl: Surf. Sci. 463, L603 (2000)
8. R.P. Andres, T. Bein, M. Dorogi, S. Feng, J.I. Henderson, C.P. Kubiak, W. Mahony, R.G. Osifchin, R. Reifenberger: Science 272, 1323 (1996)
9. [Instrum. Exp. Tech. (USSR) 40, 566 (1997)]
10. K. Reichelt, H.O. Lutz: J. Cryst. Growth 10, 103 (1971);
11. J.A. De Rose, D.B. Lampner, S.M. Lindsay, N.J. Tao: J. Vac. Sci. Technol. A 11, 776 (1993)
12. X.-Y. Zheng, Y. Ding, L.A. Bottomley, D.P. Allison, R.J. Warmack: J. Vac. Sci. Technol. B 13, 1320 (1995);
13. M. Levlin, A. Laakso, H.E.-M. Niemi, P. Hautojärvi: Appl. Surf. Sci. 115, 31 (1997);
14. Z.H. Liu, N.M. D. Brown, A. McKinley: J. Phys.: Condens. Matter 9, 59 (1997);
15. A. Putman, B.L. Blackford, M.H. Jericho, M.O. Watanabe: Surf. Sci. 217, 276 (1989);
16. C.E.D. Chidsey, D.N. Loiacono, T. Sleator, S. Nakahara: Surf. Sci. 200, 45 (1988)
17. M. Hegner, P. Wagner, G. Semenza: Surf. Sci. 291, 39 (1993)
18. J.A. De Rose, T. Thundat, L.A. Nagahara, S.M. Lindsay: Surf. Sci. 256, 102 (1991)
19. W. Bouwen, P. Thoen, F. Vanhoutte, S. Bouckaert, F. Despa, H. Weidele, R.E. Silverans, P. Lievens: Rev. Sci. Instrum. 71, 54 (2000)
20. A. Perez, P. Mélinon, V. Dupuis, P. Jensen, B. Prével, J. Tuaillon, L. Bardotti, C. Martet, M. Treilleux, M. Broyer, M. Pellarin, J.L. Vialle, B. Palpant, J. Lermé: J. Phys. D 30, 709 (1997)
21. W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M.J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, R.E. Silverans: Thin Solid Films 354, 87 (1999)
22. S.I. Vasil'ev, S.I. Oreshkin, S.V. Savinov, A. Depuydt, C. Van Haesendonck, V.I. Panov: Prib. Teck. Eksp. 4, 140 (1997)
23. [Instrum. Exp. Tech. (USSR) 40, 566 (1997)]
24. http://www.imagemet.com
25. Q. Hou, M.Hou, L. Bardotti, B. Prével, P. Mélinon, A. Perez: Phys. Rev. B 62, 2825 (2000);
26. L. Bardott, B. Prével, P. Mélinon, A. Perez, Q. Hou, M. Hou: Phys. Rev. B 62, 2835 (2000)
27. B. Pauwels, G. Van Tendeloo, W. Bouwen, L. Theil Kuhn, P. Lievens, H. Lei, M. Hou: Phys. Rev. B 62,10383 (2000)
28. P. Deltour, J.L. Barrat, P. Jensen: Phys. Rev. Lett. 78, 4597 (1997)
29. J. Li, W.-D. Schneider, R. Berndt, O.R. Bryant, S. Crampin: Phys. Rev. Lett. 80, 3332 (1998)
30. P.J.M. van Bentum, R.T.M. Smokers, H. van Kempen: Phys. Rev. Lett. 60, 2543 (1988)