Characterization of granular Ag films grown by low-energy cluster beam deposition

Thin Solid Films

Volumn 354, Issue 1, 1999, Pages 87-92

  Bouwen, W ^a   Kunnen, E ^a   Temst, K ^a   Thoen, P ^a   Van Bael, M J ^a   Vanhoutte, F ^a   Weidele, H ^a   Lievens, P ^a   Silverans, R E ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM GROWTH; GRAIN SIZE AND SHAPE; GRANULAR MATERIALS; SILICA; SILVER; SUBSTRATES; VAPORIZATION; X RAY DIFFRACTION ANALYSIS;

GRANULAR FILMS; LOW-ENERGY CLUSTER BEAM DEPOSITION;

METALLIC FILMS;

EID: 0033359067     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00571-4     Document Type: Article

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