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Physical Chemistry Chemical Physics

Volumn 3, Issue 17, 2001, Pages 3761-3768

Dielectric exchange force: A convenient technique for measuring the interfacial water relative permittivity profile

(3) Teschke, O a Ceotto, G a De Souza, E F a

a UNIVERSITY OF CAMPINAS (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

MICA; SILICON; SILICON NITRIDE; SOLVENT; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL INTERACTION; CHEMICAL STRUCTURE; DIELECTRIC CONSTANT; DIPOLE; ENERGY TRANSFER; HYDRATION; IMMERSION; MOLECULAR DYNAMICS; POLARIZATION; SURFACE PROPERTY; WATER ANALYSIS;

EID: 0034820621 PISSN: 14639076 EISSN: None Source Type: Journal
DOI: 10.1039/b009744f Document Type: Article

Times cited : (32)

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