Comparative performance, leakage power and switching power of circuits in 150nm PD-SOI and bulk technologies including impact of SOI history effect

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue CIRCUITS SYMP., 2001, Pages 217-218

  Narendra, S ^a   Tschanz, J ^a   Keshavarzi, A ^a   Borkar, S ^a   De, V ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; SWITCHING CIRCUITS; TRANSISTORS;

SWITCHING POWER;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0034798973     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)