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Journal of Analytical Atomic Spectrometry

Volumn 16, Issue 8, 2001, Pages 781-792

Characteristics of a rf-only hexapole ion-guide interface for plasma-source time-of-flight mass spectrometry

(2) Guzowski J P , Jr a Hieftje, G M a

a INDIANA UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUCTIVELY COUPLED PLASMA; ION BEAMS; ION EXCHANGE; IONIZATION; ISOTOPES; PLASMA COLLISION PROCESSES; PLASMA DEVICES; PLASMA SOURCES; PRESSURE EFFECTS; PRESSURIZATION; STAINLESS STEEL;

HEXAPOLE COLLISION CELL; INDUCTIVELY COUPLED PLASMA IONIZATION SOURCE; ION GUIDE ASSEMBLY; ION GUIDE INTERFACE; ION OPTICS; ISOTOPE RATIO; PLASMA SOURCE TIME OF FLIGHT MASS SPECTROMETRY;

MASS SPECTROMETRY;

EID: 0034741477 PISSN: 02679477 EISSN: None Source Type: Journal
DOI: 10.1039/b004381h Document Type: Article

Times cited : (28)

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