Correction of the effect of particle shape on the size distribution measured with a laser diffraction instrument

Particle and Particle Systems Characterization

Volumn 13, Issue 5, 1996, Pages 271-279

  Heffels, Camiel M G ^a   Verheijen, Peter J T ^a   Heitzmann, Daniel ^a   Scarlett, Brian ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006030699     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/ppsc.19960130504     Document Type: Article

References (8)

1. N. Gabas, N. Hiquily, C. Laguérie: Response of Laser Diffraction Particle Sizer to Anisometric Particles. Part. Part. Syst. Charact. 11 (1994) 121-126.
2. C. Heffels, D. Heitzmann, E. D. Hirleman, B. Scarlett: Forward light scattering from sharp edged-crystals in Fraunhofer and anomalous diffraction approximations. Appl. Opt. 34 (1995) 5.
3. E. Hecht: Optics, 2nd ed. Addison-Wesley, Reading, MA, 1987, Chap. 10, p. 458 and Appendix 2, p. 623.
4. C. M. G. Heffels: On-line particle size and shape characterization by small angle light scattering. PhD thesis, Delft University of Technology, Delft University Press, The Netherlands, 1995.
5. C. L. Lawson, R. J. Hanson: Solving Least Square Problems. Prentice-Hall Englewood Cliffs, NJ 1974. Chap. 23, p. 161.
6. W. H. Press, B. P. Flannery, S. A. Teukolsky, W. T. Vettering: Numerical Recipes in C: The Art of Scientific Computing. Cambridge University Press, Cambridge 1988.
7. E. D. Hirleman; Optimal Scaling of the Inverse Fraunhofer Diffraction Particle Sizing Problem: the Linear System Produced by Quadrature. Part Charact. 4 (1987) 128-133.
8. C. M. G. Heffels, D. Heitzmann, E. D. Hirleman, B. Scarlett: The Use of Azimuthal Intensity Variations in Diffraction Patterns for Particle Shape Characterization. Part. Part. Syst. Charact. 11 (1994) 194-199.