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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 24, 2000, Pages R16341-R16344

Modification of surface-state dispersion upon Xe adsorption: A scanning tunneling microscope study

(7) Park, Ji Yong a Ham, U D a Kahng, S J a Kuk, Y a Miyake, K b Hata, K b Shigekawa, H b,c

a Seoul National University (South Korea)

b UNIVERSITY OF TSUKUBA (Japan)

c UNIVERSITY OF TOKYO (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

XENON;

ARTICLE; ELECTRONICS; QUANTITATIVE ASSAY; SCANNING TUNNELING MICROSCOPY; SPECTRAL SENSITIVITY; SPECTROMETRY; SURFACE PROPERTY;

EID: 0034670901 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.R16341 Document Type: Article

Times cited : (61)

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