|
Volumn 174, Issue 1-2, 2000, Pages 253-267
|
Atomic force and optical force microscopy: Applications to interfacial microhydrodynamics
|
Author keywords
Atomic force microscopy; Interfacial microhydrodynamics; Optical force microscopy
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
HYDRODYNAMICS;
OPTICAL MICROSCOPY;
OSCILLATIONS;
PROBES;
RHEOLOGY;
VISCOSITY MEASUREMENT;
INTERFACIAL MICROHYDRODYNAMICS;
OPTICAL FORCE MICROSCOPY;
INTERFACES (MATERIALS);
ARTICLE;
ATOMIC FORCE MICROSCOPY;
COLLOID;
FLOW KINETICS;
HYDRODYNAMICS;
MICROSCOPY;
OPTICAL FORCE MICROSCOPY;
OSCILLATION;
PRIORITY JOURNAL;
SURFACE PROPERTY;
VISCOSITY;
|
EID: 0034670229
PISSN: 09277757
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-7757(00)00536-7 Document Type: Article |
Times cited : (13)
|
References (28)
|