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Volumn 72, Issue 16, 2000, Pages 3860-3866

Improvement of resolution, mass accuracy, and reproducibility in reflected mode DE-MALDI-TOF analysis of DNA using fast evaporation - Overlayer sample preparations

Author keywords

[No Author keywords available]

Indexed keywords

DNA;

EID: 0034663438     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0001941     Document Type: Article
Times cited : (40)

References (49)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.