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Volumn 126, Issue 1, 2000, Pages 1-14
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Growth, microstructure, and mechanical properties of arc evaporated TiCxN1-x (0≤x≤1) films
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Author keywords
Arc evaporation; Hardness; Residual stress; Titanium carbonitride
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Indexed keywords
ELASTIC MODULI;
EVAPORATION;
GLOW DISCHARGES;
HARDNESS;
OPTICAL MICROSCOPY;
PROTECTIVE COATINGS;
RESIDUAL STRESSES;
SODIUM CHLORIDE;
STRESS ANALYSIS;
TITANIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ARC EVAPORATION;
TITANIUM CARBONITRIDE;
CERAMIC COATINGS;
COATING;
CORROSION RESISTANCE;
HARDNESS;
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EID: 0034599427
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(00)00518-1 Document Type: Article |
Times cited : (163)
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References (29)
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