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Volumn 13, Issue 3, 2000, Pages 405-412

Acid-breakable resin-based resist for nanofabrication electron-beam lithography

Author keywords

Acid breakable resin; Acid catalyzed fragmentation; Electron beam; Positive resist; Vinylether compound

Indexed keywords

RESIN;

EID: 0034583971     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.13.405     Document Type: Article
Times cited : (10)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.