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Volumn 592, Issue , 2000, Pages 345-350

Study of stress-induced leakage current in thin oxides stressed by \ corona charging in air: relationship to goi defects

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL DEFECTS; ELECTRIC CORONA; ELECTRIC CURRENT MEASUREMENT; ELECTRON TRAPS; INDUCED CURRENTS; IRON; LEAKAGE CURRENTS; OXIDES; SURFACE ROUGHNESS;

EID: 0034505874     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (8)

References (11)
  • 8
    • 33750894245 scopus 로고    scopus 로고
    • U.S. patent pending.
    • J. Lagowski, U.S. patent pending.
    • Lagowski, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.