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Volumn 592, Issue , 2000, Pages 345-350
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Study of stress-induced leakage current in thin oxides stressed by \ corona charging in air: relationship to goi defects
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
CRYSTAL DEFECTS;
ELECTRIC CORONA;
ELECTRIC CURRENT MEASUREMENT;
ELECTRON TRAPS;
INDUCED CURRENTS;
IRON;
LEAKAGE CURRENTS;
OXIDES;
SURFACE ROUGHNESS;
CORONA CHARGING;
SEMICONDUCTOR MATERIALS;
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EID: 0034505874
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (8)
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References (11)
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