CMOS image sensor with a simple fixed-pattern-noise-reduction technology and a hole accumulation diode

IEEE Journal of Solid-State Circuits

Volumn 35, Issue 12, 2000, Pages 2038-2043

  Yonemoto, Kazuya ^a   Sumi, Hirofumi ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; CMOS INTEGRATED CIRCUITS; IMAGE CONVERTERS; NOISE ABATEMENT;

HOLE ACCUMULATION DIODES;

IMAGE SENSORS;

EID: 0034481986     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.890320     Document Type: Article

References (11)

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