Effect of copper-induced recrystallization on the piezoresistivity of germanium films

Materials Research Society Symposium - Proceedings

Volumn 618, Issue , 2000, Pages 255-258

  Khakifirooz, A ^a   Mohajerzadeh, S S ^a   Haji, S ^a   Soleimani, E A ^a  

^a UNIVERSITY OF TEHRAN   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; GRAIN GROWTH; NUCLEATION; PIEZOELECTRICITY; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GERMANIUM; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

PIEZORESISTIVITY; PRECURSOR FILMS;

SEMICONDUCTING FILMS;

EID: 0034449910     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-618-255     Document Type: Conference Paper

References (9)