Environmental impact and design parameters in electronics manufacturing - a sensitivity analysis approach

IEEE International Symposium on Electronics and the Environment

Volumn , Issue , 2000, Pages 39-45

  Siddhaye, S ^a   Sheng, P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Design optimization; Environmental impact of waste streams; Process models; Sensitivity analysis

Indexed keywords

ENVIRONMENTAL IMPACT; OPTIMIZATION; PROCESS ENGINEERING; RECYCLING; SENSITIVITY ANALYSIS;

ELECTRONIC PRODUCTS; MULTI-LAYERED INFLUENCE DIAGRAM;

ELECTRONIC EQUIPMENT MANUFACTURE;

EID: 0034446942     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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