SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 619, Issue , 2000, Pages 167-171

Optical properties of thin-film SrTiO3 on Si grown by MBE

(7) Zollner, S a Demkov, A A a Liu, R a Curless, J A a Yu, Z a Ramdani, J a Droopad, R a

a MOTOROLA INC (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELLIPSOMETRY; EPITAXIAL GROWTH; FILM GROWTH; MOLECULAR BEAM EPITAXY; PERMITTIVITY; PEROVSKITE; REFRACTIVE INDEX; SILICON; SURFACE CHEMISTRY; ULTRATHIN FILMS; ULTRAVIOLET SPECTROSCOPY;

INTERFACIAL LAYERS;

STRONTIUM COMPOUNDS;

EID: 0034446938 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-619-167 Document Type: Conference Paper

Times cited : (1)

References (6)

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2
- 4244101024
- (1998) Phys. Rev. Lett. , vol.81 , pp. 3014
- McKee, R.A.¹ Walker, F.J.² Chisholm, M.F.³

3
- 0033339409
- edited by H.R. Huff, C.A. Richter, M.L. Martin, G. Lucovsky, and T. Hattori, Mat. Res. Soc. Symp. Proc., (Mat. Res. Soc., Pittsburgh, PA)
- (1999) 2 and High-k Materials for ULSI Gate Dielectrics , vol.567 , pp. 427
- Yu, Z.¹ Droopad, R.² Ramdani, J.³ Curless, J.A.⁴ Overgaard, C.D.⁵ Finder, J.M.⁶ Eisenbeiser, K.⁷ Wang, J.⁸ Hallmark, J.A.⁹ Oomsin, W.J.¹⁰

4
- 4243286998
- in print
- Appl. Surf. Sci.
- Ramdani, J.¹ Droopad, R.² Yu, Z.³ Curless, J.A.⁴ Overgaard, C.D.⁵ Finder, J.⁶ Eisenbeiser, K.⁷ Hallmark, J.A.⁸ Ooms, W.J.⁹ Kaushik, V.¹⁰ Alluri, P.¹¹ Pietambaram, S.¹²

5
- 0003684325
- Wiley, New York
- (1999) Spectroscopic Ellipsometry and Reflectometry
- Tompkins, H.G.¹ McGahan, W.A.²

6
- 0002933681
- (1999) Critical Reviews of Optical Science and Technology , vol.CR72 , pp. 29
- Johs, B.¹ Woollam, J.A.² Herzinger, C.M.³ Hilfiker, J.N.⁴ Synowicki, R.⁵ Bungay, C.L.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.