Time-resolved in-situ x-ray diffraction study of the formation of 3D-hexagonal mesoporous silica films

Materials Research Society Symposium - Proceedings

Volumn 628, Issue , 2000, Pages

  Grosso, D ^a   Albouy, P A ^a   Amenitsch, H ^a   Balkenende, A R ^a   Babonneau, F ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM COMPOUNDS; COATING TECHNIQUES; MESOPOROUS MATERIALS; SILICON; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CETYLTRIMETHYLAMMONIUM BROMIDE; DIP COATING TECHNIQUE; THREE DIMENSIONAL HEXAGONAL MESOPOROUS SILICA FILMS; TIME RESOLVED IN SITU X RAY DIFFRACTION;

SILICA;

EID: 0034433694     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-628-cc6.17     Document Type: Conference Paper

References (13)