A 256 × 256 CMOS differential passive pixel imager with FPN reduction techniques

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2000, Pages 106-107

  Fujimori, I L ^a   Wang, C C ^a   Sodini, C G ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CHARGE TRANSFER; CMOS INTEGRATED CIRCUITS; DIFFERENTIAL AMPLIFIERS; DIFFERENTIATING CIRCUITS; DYNAMIC RANDOM ACCESS STORAGE; PHOTODIODES; SAMPLING; SPURIOUS SIGNAL NOISE; TRANSISTORS;

CORRELATED DOUBLE SAMPLING (CDS); FIXED PATTERN NOISE (FPN); PASSIVE PIXEL SENSORS;

IMAGE SENSORS;

EID: 0034429681     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Operation of p-n junction photodetectors in a photon flux integration mode
2. CMOS image sensors: Electronic camera-on-a-chip
3. A memory read-out approach for a 0.5μm CMOS image sensor
4. Characterization of CMOS photodiodes for imager application