XAFS spectroscopy; fundamental principles and data analysis

Topics in Catalysis

Volumn 10, Issue 3-4, 2000, Pages 143-155

  Koningsberger, D C ^a   Mojet, B L ^a,c   Van Dorssen, G E ^a   Ramaker, D E ^b  

^a UTRECHT UNIVERSITY   (Netherlands)

^b GEORGE WASHINGTON UNIVERSITY   (United States)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Detection of low Z scatterers; Difference file technique; Fitting in R space; Phase and amplitude corrected Fourier transforms; Use of theoretical references; XAFS data analysis; XAFS physical principles

Indexed keywords

EID: 0034419752     PISSN: 10225528     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1019105310221     Document Type: Article

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