Multiple solutions in data fitting: A trap in EXAFS structural analysis and some ideas to avoid it

Journal of Synchrotron Radiation

Volumn 5, Issue 5, 1998, Pages 1317-1320

  Michalowicz, Alain ^a   Vlaic, Gilberto ^b,c  

^a UNIVERSITÉ PARIS EST CRÉTEIL   (France)

^b UNIVERSITY OF TRIESTE   (Italy)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

EXAFS data analysis

Indexed keywords

EID: 0032222064     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049598002970     Document Type: Article

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