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Volumn 44, Issue 8-9, 1998, Pages 1283-1287

'Atomic' X-ray absorption fine structure: A new tool for examining electrochemical interfaces

Author keywords

Atomic XAFS; Electrochemistry; EXAFS; In situ X ray absorption spectroscopy; XAS

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC SPECTROSCOPY; CARBON; ELECTROCHEMISTRY; INTERFACES (MATERIALS); PLATINUM; SULFURIC ACID; X RAY SPECTROSCOPY;

ATOMIC X RAY ABSORPTION FINE STRUCTURE (AXAFS);

ELECTROCHEMICAL ELECTRODES;

EID: 0032288445 PISSN: 00134686 EISSN: None Source Type: Journal
DOI: 10.1016/S0013-4686(98)00249-7 Document Type: Article

Times cited : (23)

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