XRF analysis of powder microsamples of multielement mono-and polycrystals. Determination of Cr, Mn, Ni, Mu, Zn, Ga, As, Se, Sb, Yb

Chemia Analityczna

Volumn 45, Issue 3, 2000, Pages 415-428

  Jurczyk, Jerzy ^a   Sitko, Rafał ^a   Zawisza, Beata ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

Microsamples; Mono and polycrystals; Thin layer method; XRF

Indexed keywords

EID: 0034419178     PISSN: 00092223     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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