Semimicroanalysis of silicate minerals by means of XRF thin layer method. Determination of selected chromatic elements - V, Cr, Mn, Fe, Co

Chemia Analityczna

Volumn 42, Issue 5, 1997, Pages 703-713

  Jurczyk, Jerzy ^a   Buhl, Franciszek ^a   Sitko, Rafał ^a   Fabiś, Marek ^a   Czaja, Maria ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

Minerals; Thin layer method; X ray fluorescence analysis

Indexed keywords

EID: 0031522488     PISSN: 00092223     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (13)

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6. Nazarenko V. and Polluektov N.S., Semimicroanalysis of minerals and rocks, Moskow 1950 (in Russian).
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