Multielement XRF aalysis of mono-and polycrystal microsamples by the thin layer method. Determination of Ni, Cu, Zn, Ga, Cd, Cr, Se

Chemia Analityczna

Volumn 43, Issue 2, 1998, Pages 185-195

  Jurczyk, Jerzy ^a   Sitko, Rafał ^a   Buhl, Franciszek ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

Microsamples; Mono and polycrystals; Thin layer method; XRF analysis

Indexed keywords

EID: 0040577259     PISSN: 00092223     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (26)

1. McDeviltt J.T., Riley D.R. and Haupt S.G., Anal. Chem., 65, 535 (1993)
2. Mroziewicz B., Bugajski M. and Nakwaski N., Physics of Semiconductor Lasers, PWN, Warszawa 1991.
3. Vasileva M.G., Lalukina V.M., Yermakova L.V., Obolestnik V.A., Asatyanin N.G. and Veschitkatschyan M.T., Analiz Poluprovodnikovikh Splavov, Metallurgisdat, 1975.
4. Sandell E., Colorimetric determination of Traces of Metals, Interscience, New York, 1959.
5. Analyse der Metalle II/I. Betriebsanalyse I. Teil, Springer Verlag, 1961.
6. Kazunobu Kodama, Methods of Quantitative Inorganic Analysis, Interscience, New York, 1963.
7. Kulkarni M.J., Argekar A.A., Thulasidas S.K., Page A.G. and Sastry M.D., Fresenius J. Anal. Chem., 342, 367 (1992).
8. Jianzhang Z., Vasileva J.G., Gibner J.I., Shilkina T.Y. and Boris Z.J., J. Fresenius J. Anal. Chem., 342, 363 (1992).
9. Doto K., Japan Analyst, 981, 17 (1968).
10. Shevtsov N.I., Blank A.B., Nartova Z.M., Mirenskaya J.J., Eksperiandova L.P. and Sumarokov S.J., Zav. Lab., 56, 10 (1990).
11. Shevtsov N.I., Nartova Z.M., Kviczko L.A. and Blank A.B., Zh. Anal. Chem., 46, 591 (1991).
12. Jurczyk J., Buhl F. and Wilczek I., Chem. Anal. (Warsaw), 38, 519 (1993).
13. Newburg D.E., Swyt C.R. and Hyklebust R.L., Anal. Chem., 67, 1866 (1995).
14. Treiger B.A., Bondarenko I.I., Mazalov L.N. and Rezvickij W.W., Zh. Anal. Chem., 49, 389 (1994).
15. Okońska-Kozłowska I., Z. Anorg. Chem., 558, 225 (1989).
16. Okońska-Kozłowska I., Kopyczok I. and Jung M., Z. Anorg. Chem., 571, 157 (1989).
17. Kliment V., J. Radional. Nucl. Chem., 155, 91 (1991).
18. Hoffman P., Lieser K.H., Hein M. and Flakowski M., Spectrochim. Acta, 44B, 471 (1989).
19. Nedeltcheva T., Simeonova P. and Lovchinov V., Anal. Lab., 4, 38 (1995).
20. Watanabe K., Demura K. and Fueki K., Bull. Chem. Soc. Jpn., 67, 1024 (1994).
21. Gautier E.A., Gettar R. and Servant R.E., Anal. Chim. Acta, 283, 350 (1993).
22. Zhao Y.Z., Fenxi-Shiyanshi, 12, 67 (1993).
23. Bertin E.P., Principles and Practice of X-Ray Spectrometric Analysis, Plenum Press, New York 1975.
24. Jenkins R., Gould R.W. and Gedke D., Quantitative X-Ray Spectrometry, Marcel Dekker, New York 1981.
25. Handbook of X-Ray Spectrometry, Eds. R. van Grieken, A. Markowicz, Marcel Dekker, 1993.
26. Hertroys P. de Vries J.L., Counting Strategy, Philips Scientific Reports, 16415/OL, (1967).