Depth profiling study of the CdTe/CdS/ITO/glass heterostructure with AES and GIXRD

Physica Status Solidi (B) Basic Research

Volumn 220, Issue 1, 2000, Pages 261-267

  Martel, A ^a   Caballero Briones, F ^b   Oliva, A I ^c   Castro Rodriguez R ^b,c   Iribarren, A ^c   Bartolo Perez P ^b,c   Pena J L ^b,c  

^a UNIVERSITY OF HAVANA   (Cuba)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^c DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034341731     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200007)220:1<261::AID-PSSB261>3.0.CO;2-4     Document Type: Article

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