Surface phases analysis by grazing incidence of X-rays in a Bragg-Brentano diffractometer

Applied Surface Science

Volumn 93, Issue 4, 1996, Pages 349-352

  Battaglia, Stefano ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFRACTOMETERS; INTERFACES (MATERIALS); SECONDARY ION MASS SPECTROMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

BRAGG LINE; BRAGG-BRENTANO DIFFRACTOMETER; GRAZING; SURFACE PHASE ANALYSIS;

SURFACES;

EID: 0030123134     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00344-4     Document Type: Article

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