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Volumn 85, Issue 3, 2000, Pages 123-129
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Parameters affecting specimen flatness of two-dimensional crystals for electron crystallography
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Author keywords
Cryomicroscopic methods; Electron diffraction; Specimen preparation and handling
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Indexed keywords
CARBON;
COMPOSITION EFFECTS;
COOLING;
COPPER;
ELECTRON DIFFRACTION;
EVAPORATION;
SCANNING ELECTRON MICROSCOPY;
SPECIMEN PREPARATION;
THERMAL EXPANSION;
TITANIUM;
TWO DIMENSIONAL;
CRYOCRINKLING;
CRYOMICROSCOPIC METHODS;
ELECTRON CRYSTALLOGRAPHY;
CRYSTALLOGRAPHY;
CARBON;
COPPER;
LIQUID NITROGEN;
MOLYBDENUM;
PROTEIN;
TITANIUM;
ARTICLE;
CONTROLLED STUDY;
COOLING;
CRYSTAL;
CRYSTALLOGRAPHY;
ELECTRON DIFFRACTION;
FILM;
MATERIALS;
METHODOLOGY;
SAMPLE;
SCANNING ELECTRON MICROSCOPY;
TECHNIQUE;
BACTERIORHODOPSINS;
CARBON;
CRYOELECTRON MICROSCOPY;
CRYSTALLOGRAPHY;
MICROSCOPY, ELECTRON, SCANNING;
MOLYBDENUM;
PURPLE MEMBRANE;
RESEARCH SUPPORT, NON-U.S. GOV'T;
TITANIUM;
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EID: 0034333321
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(00)00052-8 Document Type: Article |
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Times cited : (35)
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References (16)
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