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Volumn 63, Issue 3-4, 1996, Pages 263-272

Analysis of carbon film planarity by reflection light microscopy

Author keywords

carbon films; electron microscopy; low temperature; mica; nitrocellulose; reflection light microscopy; wrinkling

Indexed keywords

CRYSTALLOGRAPHY; DISSOLUTION; ELECTRON REFLECTION; MACROMOLECULES; NITROCELLULOSE;

EID: 0030199093     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00044-7     Document Type: Article
Times cited : (7)

References (20)
  • 1
    • 0002338978 scopus 로고
    • The preparation of specimen support films
    • Ed. D. Kay (Blackwell Scientific Publications, Oxford)
    • [1] D.E. Bradley, The preparation of specimen support films, in: Techniques for Electron Microscopy, Ed. D. Kay (Blackwell Scientific Publications, Oxford, 1965) p. 58.
    • (1965) Techniques for Electron Microscopy , pp. 58
    • Bradley, D.E.1
  • 5
    • 0011908326 scopus 로고
    • Replica, shadowing and freeze-etching techniques: Practical methods
    • North-Holland Publishing Co., Amsterdam
    • [5] J.H.M. Willison and A.J. Rowe, Replica, Shadowing and Freeze-etching Techniques: Practical Methods, in: Electron Microscopy, Vol.8 (North-Holland Publishing Co., Amsterdam, 1980).
    • (1980) Electron Microscopy , vol.8
    • Willison, J.H.M.1    Rowe, A.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.