메뉴 건너뛰기




Volumn 44, Issue 11, 2000, Pages 1949-1954

Comparison of npn and pnp profile design tradeoffs for complementary SiGe HBT Technology

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONSTRAINT THEORY; ELECTRIC SPACE CHARGE; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON COMPOUNDS;

EID: 0034324422     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00165-9     Document Type: Article
Times cited : (12)

References (9)
  • 1
    • 0032072280 scopus 로고    scopus 로고
    • SiGe HBT technology: A new contender for Si-based RF and microwave circuit applications
    • Cressler J.D. SiGe HBT technology: a new contender for Si-based RF and microwave circuit applications. IEEE Trans Microwave Theory Tech. 46(5):1998;572-589.
    • (1998) IEEE Trans Microwave Theory Tech , vol.46 , Issue.5 , pp. 572-589
    • Cressler, J.D.1
  • 8
    • 0001464737 scopus 로고
    • The thermal stability of SiGe films deposited by ultrahigh-vacuum chemical vapor deposition
    • Stiffler S.R., Comfort J.H., Harame C.L., de Frésart E., Meyerson B.S. The thermal stability of SiGe films deposited by ultrahigh-vacuum chemical vapor deposition. J Appl Phys. 70(3):1991;1416-1420.
    • (1991) J Appl Phys , vol.70 , Issue.3 , pp. 1416-1420
    • Stiffler, S.R.1    Comfort, J.H.2    Harame, C.L.3    De Frésart, E.4    Meyerson, B.S.5
  • 9
    • 0033885090 scopus 로고    scopus 로고
    • An equilibrium model for buried SiGe strained layers
    • Fischer A., Osten H-J., Richter H. An equilibrium model for buried SiGe strained layers. Solid-State Electron. 44:2000;869-873.
    • (2000) Solid-State Electron , vol.44 , pp. 869-873
    • Fischer, A.1    Osten, H.-J.2    Richter, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.