STM observations of exchange dynamics at the solid-liquid interface using a molecular tracer

Journal of Physical Chemistry B

Volumn 104, Issue 43, 2000, Pages 9945-9946

  Padowitz, David F ^a   Messmore, Benjamin W ^a  

^a AMHERST COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHEMICAL ANALYSIS; ETHERS; GRAPHITE; INTERFACES (MATERIALS); MONOLAYERS; OXYGEN; SCANNING TUNNELING MICROSCOPY; SULFUR;

MOLECULAR EXCHANGE DYNAMICS; MOLECULAR TRACERS; SOLID-LIQUID INTERFACES; THIOETHER HEXADECYL SULFIDE; TRITRIACONTANE;

MOLECULAR DYNAMICS;

EID: 0034322571     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp002198f     Document Type: Article

References (24)

1. Cyr, D. M.; Venataraman, B.; Flynn; G. W. Chem. Mater. 1996, 8, 1600-1615.
2. Rabe, J. P. Surfactant Sci. Ser. 1999, 83, 65-82.
3. De Feyter, S.; Gesquière, A.; Abdel-Mottaleb, M. M.; Grim, P. C. M.; De Schryver, F. C.; Meiners, C.; Sieffert, M.; Valiyaveettil, S.; Müllen; K. Acc. Chem. Res. 2000, 33, 520-531.
4. Claypool, C. L.; Faglioni, F.; Goddard, W. A., III.; Gray, H. B.; Lewis, N. S.; Marcus, R. A. J. Phys. Chem. B 1997, 101, 5978-5995.
5. Cyr, D. M.; Venataraman, B.; Flynn; G. W. J. Phys. Chem. 1996, 100, 13747-13759.
6. Giancarlo, L. C.; Flynn, G. W. Acc. Chem. Res. 2000, in press.
7. Stabel, R. A.; Heinz, R.; De Schryver, F. C.; Rabe, J. P. J. Phys. Chem. 1995, 99, 505-507.
8. Hibino, M.; Sumi, A.; Hatta, I. Thin Solid Films 1996, 273, 272-278.
9. Gunning, A. P.; Kirby, A. R.; Mallard, X.; Morris, V. J. J. Chem. Soc., Faraday Trans. 1994, 90, 2551-2554.
10. Rabe, J. P.; Bucholz, S. Phys. Rev. Lett. 1991, 66, 2096-2099.
11. Rabe, J. P.; Buchholz, S. Science 1991, 253, 424-427.
12. Heinz, R.; Rabe, J. P.; Meister, W.-V.; Hoffmann, S. Thin Solid Films 1995, 264, 246-249.
13. Patrick, D. L.; Cee, V. J.; Beebe, T. P., Jr. Science 1994, 265, 231-234.
14. Eichhorst-Gerner, K.; Stabel, A.; Moessner, G.; Declerq, D.; Valiyaveettil, S.; Enkelmann, C.; Müllen, K.; Rabe, J. P. Angew. Chem., Int. E. Engl. 1996, 35, 1492-1495.
15. Baker, E.; Moungous, J. D.; Brackley, A.; Patrick, D. L. Langmuir 1999, 15, 4884-4891.
16. Hibino, M.; Sumi, A.; Hatta, I. Thin Solid Films 1996, 281-282, 594-597.
17. Elbel, N.; Roth, W.; Günther, E.; von Seggern, H. Surf. Sci. 1994, 303, 424-432.
18. Stevens, F.; Beebe, T. P., Jr. Langmuir 1999, 15, 6884-6889.
19. Stabel, A.; Heinz, R.; Rabe, J. P.; Wegner, G. J. Phys. Chem. 1995, 99, 8690-8697.
20. Herwig, K. W.; Matthies, B.; Taub, H. Phys. Rev. Lett. 1995, 75, 3154-3157.
21. Askadskaya, L.; Rabe, J. P. Phys. Rev. Lett. 1992, 69, 1395-1398.
22. Magonov, S. N.; Wawkuschewski, A.; Cantow, H. J.; Liang, W.; Whangbo, M. H. Appl. Phys. A 1994, 59, 119-133.
23. Kotelyanskii, M. J.; Hentschke R. Phys. Rev. E 1994, 49, 910-913.
24. Granick, S. Science 1991, 253, 1374-1379.