Electrical modelling of Si/SiO2 superlattices

Journal of Physics D: Applied Physics

Volumn 33, Issue 21, 2000, Pages 2691-2698

  Ouisse, T ^a,b   Ioannou Sougleridis, V ^b   Kouvatsos, D ^b   Nassiopoulou, A G ^b  

^a CNRS   (France)

^b INSTITUTE OF MICROELECTRONICS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTROLUMINESCENCE; OPTIMIZATION; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR QUANTUM WELLS; SILICA; THERMOANALYSIS;

CONFINED SILICON STRUCTURES;

SEMICONDUCTOR SUPERLATTICES;

EID: 0034321498     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/21/305     Document Type: Article

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