Approach to computer-aided quality control based on 3D coordinate metrology

Journal of Materials Processing Technology

Volumn 107, Issue 1-3, 2000, Pages 96-110

  Wolf, Kai ^a   Roller, Dieter ^b   Schäfer, Dirk ^b  

^a Siemensstraße 3   (Germany)

^b Inst Comp Sci B   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; MATHEMATICAL MODELS; OPTIMIZATION; PRODUCT DESIGN; PRODUCT DEVELOPMENT; PROJECTION SYSTEMS; QUALITY CONTROL; RAPID PROTOTYPING; SOFTWARE PROTOTYPING; SPATIAL VARIABLES MEASUREMENT; THREE DIMENSIONAL;

CODED LIGHT APPROACH; COMPUTER AIDED QUALITY CONTROL; THREE DIMENSIONAL COORDINATE METROLOGY;

COMPUTER AIDED MANUFACTURING;

EID: 0034318528     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(00)00668-3     Document Type: Article

References (10)

1. W.H. Press, S.A. Teukolsky, W.T. Vetterling, B.P. Flannery, Numerical recipes in C, The Art of Scientific Computing, Cambridge University Press, Cambridge, 1992.
2. Besl P.J., McKay N.D. A method for registration of 3D shapes. IEEE Trans. Pattern Anal. Mach. Intelligence. 14(2):1992;239-256.
3. Horn B.K.P. Closed-form solution of absolute orientation using unit quaternions. J. Opt. Soc. Am. 4(4):1987;629-642.
4. K. Wolf, Hochgenaue 3D vermessung mit codiertem licht und phasenshiftverfahren, Institut für Nachrichten-vermittlung und Datenverarbeitung (IND), Universität Stuttgart, 2, Studienarbeit, 1996.
5. http://www.ti.com/dlp.
6. http://www.jvc.com/pro/dila/HOME.htm.
7. K. Wolf, Short Form Description of ABW-VIS, ABW GmbH, Siemensstraße 3, D-72636 Frickenhausen, Germany.
8. Choi W., Kurfess T.R., Cagan J. Sampling uncertainty in coordinate measurement data analysis. Prec. Eng. 22:1998;153-163.
9. Choi W., Kurfess T.R. Uncertainty of extreme fit evaluation for three-dimensional measurement data analysis. Computer-aided Des. 30(7):1998;549-557.
10. Gallagher T., Kurfess T.R. Design and implementation of a system for rapid inspection of critical dimensions in high volume production. Mechatronics. 87(7):1998;413-425.